Modeling and Simulation for the Accelerated Development of Materials

Award Information
Agency:
Department of Defense
Amount:
$99,998.00
Program:
SBIR
Contract:
FA8650-04-M-5241
Solitcitation Year:
2004
Solicitation Number:
2004.1
Branch:
Air Force
Award Year:
2004
Phase:
Phase I
Agency Tracking Number:
F041-155-1597
Solicitation Topic Code:
AF04-155
Small Business Information
RNET TECHNOLOGIES, INC.
555 Bryant Street , #578, Palo Alto, CA, 94301
Hubzone Owned:
N
Woman Owned:
Y
Socially and Economically Disadvantaged:
Y
Duns:
141943030
Principal Investigator
 Ram Balasubramanian
 VP for Government Projects
 (650) 248-3371
 ram@rnet-tech.com
Business Contact
 Ram Balasubramanian
Title: VP for government Projects
Phone: (650) 248-3371
Email: ram@rnet-tech.com
Research Institution
N/A
Abstract
AF04-155 proposes a reduction in the maturation time between the identification of a novel material and its entry into service, in part through improved experimental characterization and evaluation. The development of a monitoring system capable of acquiring and processing full-field data from the surface of a material, and simultaneously detecting the presence and location of short fatigue cracks, would promote a more rapid understanding of the fatigue behavior of the material and thus expedite fatigue testing programs. RNET proposes the development of an advanced Infrared Damage Detection System (IDDS) capable of such real-time analysis. Using a staring-array infrared detector to record the thermal emission from a material surface, the system will allow the continuous inspection of a fatigue test at temperatures which are representative of the in-service conditions for gas turbine materials. An operator will be able to view, via a computer system, full-field visual feedback from algorithms which will indicate the presence of both fatigue cracks and other infrared signatures, whilst differentiating between them. The IDDS developed during this SBIR will comprise an infrared camera and lens system, associated cabling and computer interface cards, a desktop computer, and software suite for `turnkey' infrared damage monitoring and short crack detection.

* information listed above is at the time of submission.

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