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INTELLIGENT DRIVERS USING OPTICAL SENSING

Award Information
Agency: Department of Defense
Branch: Defense Advanced Research Projects Agency
Contract: W31P4Q-08-C-0328
Agency Tracking Number: 06ST1-0082
Amount: $749,779.00
Phase: Phase II
Program: STTR
Solicitation Topic Code: ST061-009
Solicitation Number: N/A
Timeline
Solicitation Year: 2006
Award Year: 2008
Award Start Date (Proposal Award Date): 2008-06-18
Award End Date (Contract End Date): 2010-05-13
Small Business Information
15 WARD STREET
SOMERVILLE, MA 02143
United States
DUNS: 106771140
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Michael Booth
 PI
 (617) 547-1122
 mbooth@srl.com
Business Contact
 Jonah Jacob
Title: President
Phone: (617) 547-1122
Email: jjacob@srl.com
Research Institution
 PENN STATE
 KEVIN WHITE
 
ELECTRO-OPTICS CENTER 222 NORTHPOINTS BLVD
FREEPORT, PA 16229
United States

 (724) 295-7019
 Nonprofit College or University
Abstract

The development of a practical, easily-implemented device that can extend the lifetimes of existing diode lasers would lead to extended service and lower costs and cost-of-ownership. Such a device extends the lifetimes of diode lasers by shutting off the supply current when formation of a potentially damaging current filament appears likely. This allows the diode to return to its initial state with no memory of filamentation. We have artificially generated optical transients by applying current pulses atop the normal, regulated drive currents of laser diodes to observe the result of such aberrant behavior of the laser’s properties and lifetime. We have studied the optical and electrical behavior to correlate excursions in both that indicate performance-degrading faults. The plan is to use such optical transients as predictors of potentially damaging faults, and to use this to trigger a protection circuit that will shut down the drive current for a short time and allow the diode to return to a safe state before resuming operation. The optically-triggered protection circuit combined with a constant current supply will then be tested on LDAs to demonstrate that it increases the working lifetime of off-the-shelf laser diodes.

* Information listed above is at the time of submission. *

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