FLAW INSPECTION IN NONFERROUS CONDUCTORS USING MAGNETO- OPTIC DETECTION METHODS

Award Information
Agency: National Science Foundation
Branch: N/A
Contract: N/A
Agency Tracking Number: 1797
Amount: $193,000.00
Phase: Phase II
Program: SBIR
Awards Year: 1986
Solitcitation Year: N/A
Solitcitation Topic Code: N/A
Solitcitation Number: N/A
Small Business Information
Sigma Research, Inc.
565 Industry Drive, Seattle, WA, 98188
Duns: N/A
Hubzone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 G.l. Fitzpatrick
 Senior Scientist
 () -
Business Contact
 G.L. FITZPATRICK,
Title: SENIOR SCIENTIST
Phone: () -
Research Institution
N/A
Abstract
A NEW METHOD FOR ACHIEVING VISUALIZATION OF FLAWS IN NONFERROUS CONDUCTORS SUCH AS ALUMINUM IS PROPOSED. LESS DIRECT VISUALIZATION TECHNIQUES, INCLUDING EDDY CURRENT AND DYE PENETRANT TECHNIQUES, ALREADY EXIT. HOWEVER, THESE METHODS ARE TIME CONSUMING AND REQUIRE CONSIDERABLE SUPPORT AND PREPARATION. THE NEW METHOD PROPOSES TO ACCOMPLISH DIRECT VISUALIZATION OF FLAWS IN NONFERROUS MATERIALS USING MAGNETIC GARNET FILMSDETECTORS OF MAGNETIC FIELDS ASSOCIATED WITH EDDY CURRENTS. BY ILLUMINATINF SUCH FILMS WITH PLANE POLARIZED LIGHT AND USING A POLARIZING ANALYZER, THE MAGNETIC DOMAIN SSTRUCTURE OF THE FILM CAN BE MADE DIRECTLY VISIBLE. THAT IS,THE COMPONENT OF THEMAGNETIC FLUX PERPENDICULAR TO THE FILMSURFACE PRODUCES EITHER A DARK AREA, A LIGHT GREEN AREA OR AN INTERMEDIATE "GRAY" VALUE. SINCE THE DOMAINS ARE ALTERED MAGNETIC FIELDS ASSOCIATED WITH EDDY CURRENTS PERTURBED BY FLAWS, A METHOD OF DIRECT VISUALIZATION OF FLAWS MAY BE ACHIEVED.

* information listed above is at the time of submission.

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