N/A

Award Information
Agency:
National Science Foundation
Branch
n/a
Amount:
$500,000.00
Award Year:
2001
Program:
SBIR
Phase:
Phase II
Contract:
0091454
Award Id:
55498
Agency Tracking Number:
0091454
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
1570 Pacheco Street Suite E-11, Santa Fe, NM, 87505
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
FredGnadinger
(505) 984-1322
djkane@swsciences.com
Business Contact:
AlanStanton
President
(505) 988-9230
astanton@swsciences.com
Research Institute:
n/a
Abstract
This Small Business Innovation Research (SBIR) Phase II project will develop a prototype high speed, non-invasive, optical probe for electric fields, and hence waveforms, in semiconductor devices. The technique is designed to work on any semiconductor regardless of its crystal structure and can be used for both imaging and single point detection without degradation of temporal resolution. Because the technique is optically based, no parasitic capacitance is added to the device being measured. A femtosecond laser probes the device to be measured, and temporal resolution is several orders of magnitude faster than the time resolution required to probe present devices. Bandwidths of greater than 10 terahertz should be possible. This non-invasive probe technique will be applied to silicon-based devices. In their production and testing in the semiconductor industry

* information listed above is at the time of submission.

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