Wet Film Thickness Sensor/Device for Navy Platforms

Award Information
Agency:
Department of Defense
Amount:
$69,999.00
Program:
SBIR
Contract:
N00014-05-M-0155
Solitcitation Year:
2005
Solicitation Number:
2005.1
Branch:
Navy
Award Year:
2005
Phase:
Phase I
Agency Tracking Number:
N051-068-0246
Solicitation Topic Code:
N05-068
Small Business Information
SYSTEMS & MATERIALS RESERACH CONSULTANCY
19300 Crosswind Circle, Spicewood, TX, 78669
Hubzone Owned:
N
Woman Owned:
N
Socially and Economically Disadvantaged:
N
Duns:
033171534
Principal Investigator
 Alan Bray
 President/Principal Scientist
 (512) 263-0822
 alanbray@systemsandmaterials.com
Business Contact
 Alan Bray
Title: President/Principal Scientist
Phone: (512) 263-0822
Email: alanbray@systemsandmaterials.com
Research Institution
N/A
Abstract
Measuring dry film thickness (DFT) with microwave nondestructive evaluation (MNDE) to ¼ mil accuracy has been demonstrated by SMRC's recently introduced K-band MNDE DFT tool. Extending to wet film thickness (WFT) measurement over unknown DFT requires a dual-sensor approach. X-band data for WFT over DFT in high solids paint (80% Zn) are promising - changes in microwave response as the paint dries are clear indications that SAPACS WFT measurements are feasible. In Phase I three X-band MNDE sensors will be built with standoffs from 4" - 6" with at least 1/2 mil accuracy in WFT over DFT, and 1/4 mil over metal substrates. SMRC proposes to build a detailed SAPACS WFT measurement model to support developing a design that minimizes systematic and random noise due to SAPACS motion and hull morphology. Sensor calibration data for WFT and DFT will be collected for single and multiple layers and types of hull paints. The X-band units will be combined into a dual-sensor system in Phase I Option as a pre-prototype SAPACS WFT MNDE measurement tool. The WFT measurement model will be continuously updated with DFT/WFT calibration and sensitivity data, making it a realistic, valuable design tool for Phase II development.

* information listed above is at the time of submission.

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