OF FIRST WALL MATERIALS

Award Information
Agency: Department of Energy
Branch: N/A
Contract: N/A
Agency Tracking Number: 2526
Amount: $48,739.00
Phase: Phase I
Program: SBIR
Awards Year: 1985
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
4401 Dayton Xenia Road, Dayton, OH, 45432
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 DR. DAVID INGRAM
 PRINCIPAL INVESTIGATOR
 (513) 426-6900
Business Contact
Phone: () -
Research Institution
N/A
Abstract
THE USE OF ENERGETIC ION BEAMS TO IMPROVE THE INTEGRITY OF POTENTIAL FIRST WALL MATERIALS SUCH AS TIC, SIC, AND CX-C IS PLANNED. IN PARTICULAR, IMPROVEMENTS IN PROPERTIES SUCH AS POROSITY, ADHESION, RESISTANCE TO TO DAMAGE BY THERMAL SHOCK, AND RESISTANCE TO RADIATION DAMAGE ARE ENVISAGED, LOW ENERGY (<1KEV) ION BEAMS WILL BE USED TO DEPOSIT THE MATERIALS AS WELL AS MODIFY THEIR STRUCTURE. THIS TECHNIQUE PRODUCES MATERIAL THAT IS USUALLY MORE DENSE AND MORE ADHERENT TO THE SUBSTRATE THAN THAT PRODUCED BY CONVENTIONAL DEPOSITION TECHNIQUES. IN ADDITION, HEAVY AND LIGHT MEV ION BEAMS WILL BE USED AS A RESEARCH TOOL TO DETERMINE THE EFFECTS OF RADIATION DAMAGE ON THESE FILMS, INCLUDING ANY FURTHER IMPROVEMENT IN ADHESION. MEV ION BEAM ANALYSIS TECHNIQUES SUCH AS RUTHERFORD BACKSCATTERING AND PROTON RECOIL DETECTION WILL BE USED TO EXAMINE THE ELEMENTAL COMPOSITION, INCLUDING HYDROGEN, OF THE DEPOSITED FILMS.

* Information listed above is at the time of submission. *

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