NEW METHOD FOR MEASURING TRACE ELEMENTS IN II-VI SEMICONDUCTING MATERIALS

Award Information
Agency: Department of Defense
Branch: Army
Contract: N/A
Agency Tracking Number: 9249
Amount: $500,000.00
Phase: Phase II
Program: SBIR
Awards Year: 1990
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
180 Zachary Rd - #5, Manchester, NH, 03103
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 James R Valentine
 (603) 622-7660
Business Contact
Phone: () -
Research Institution
N/A
Abstract
MEASUREMENT OF CRITICAL TRACE LEVEL ELEMENTS IN SEMICONDUCTING MATERIALS MAY BE POSSIBLE USING A SPECIAL ATOMIC ABSORPTION SPECTROPHOTOMETRY TECHNIQUE. DIRECT VAPORIZATION OF SOLID SAMPLES COMBINED WITH A HIGHLY EFFICIENT SYSTEM TO CORRECT FOR NON-ANALYTE ABSORPTION WILL BE INVESTIGATED ON CDTE MATERIALS.

* Information listed above is at the time of submission. *

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