NEW METHOD FOR MEASURING TRACE ELEMENTS IN II-VI SEMICONDUCTING MATERIALS

Award Information
Agency:
Department of Defense
Branch:
Army
Amount:
$500,000.00
Award Year:
1990
Program:
SBIR
Phase:
Phase II
Contract:
N/A
Agency Tracking Number:
9249
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Vhg Laboratorys Inc.
180 Zachary Rd - #5, Manchester, NH, 03103
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
N/A
Principal Investigator
 James R Valentine
 (603) 622-7660
Business Contact
Phone: () -
Research Institution
N/A
Abstract
MEASUREMENT OF CRITICAL TRACE LEVEL ELEMENTS IN SEMICONDUCTING MATERIALS MAY BE POSSIBLE USING A SPECIAL ATOMIC ABSORPTION SPECTROPHOTOMETRY TECHNIQUE. DIRECT VAPORIZATION OF SOLID SAMPLES COMBINED WITH A HIGHLY EFFICIENT SYSTEM TO CORRECT FOR NON-ANALYTE ABSORPTION WILL BE INVESTIGATED ON CDTE MATERIALS.

* information listed above is at the time of submission.

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