NEW METHOD FOR MEASURING TRACE ELEMENTS IN II-VI SEMICONDUCTING MATERIALS

Award Information
Agency:
Department of Defense
Branch
Army
Amount:
$500,000.00
Award Year:
1990
Program:
SBIR
Phase:
Phase II
Contract:
n/a
Award Id:
9249
Agency Tracking Number:
9249
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
180 Zachary Rd - #5, Manchester, NH, 03103
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
James R Valentine
(603) 622-7660
Business Contact:
() -
Research Institute:
n/a
Abstract
MEASUREMENT OF CRITICAL TRACE LEVEL ELEMENTS IN SEMICONDUCTING MATERIALS MAY BE POSSIBLE USING A SPECIAL ATOMIC ABSORPTION SPECTROPHOTOMETRY TECHNIQUE. DIRECT VAPORIZATION OF SOLID SAMPLES COMBINED WITH A HIGHLY EFFICIENT SYSTEM TO CORRECT FOR NON-ANALYTE ABSORPTION WILL BE INVESTIGATED ON CDTE MATERIALS.

* information listed above is at the time of submission.

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