Radiation Hard, High Precision, Agile Star Tracker

Award Information
Agency: Department of Defense
Branch: Missile Defense Agency
Contract: W9113M-06-C-0094
Agency Tracking Number: 053-0664
Amount: $100,000.00
Phase: Phase I
Program: SBIR
Awards Year: 2006
Solicitation Year: 2005
Solicitation Topic Code: MDA05-030
Solicitation Number: 2005.3
Small Business Information
12725 SW Millikan Way, Suite 230, Beaverton, OR, 97005
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 George Soli
 Principal Engineer
 (971) 223-5646
Business Contact
 George Williams
Title: President
Phone: (971) 223-5646
Email: georgew@voxtel-inc.com
Research Institution
In this program, Voxtel will demonstrate SOI-CMOS imagers for high-performance star tracking applications. Fabricating CMOS imagers on SOI wafers, allows the device and detector layers to be separated with an insulating layer, so each can be individually optimized and operated with separate ground returns. High QE and high MTF come from backside illumination and depleting the entire volume of detector through substrate bias and high resistivity silicon. SOI-CMOS circuits offer immunization from radiation and SOI-CMOS reduces parasitic capacitances, which eliminates substrate bounce, and transient coupling problems. SOI's planar structure also makes it easier to passivate surfaces for low dark-current. This advantage, in turn, makes the device more resistant to ionizing radiation. SOI also allows ADCs and other functions to be easily integrated on chip without degrading imaging performance. The resulting imagers have higher operating speeds, lower readout noise, and lower fixed-pattern-noise. In Phase I, we will fabricate, characterize, and radiation test prototype SOI CMOS imagers, and we will demonstrate how high frame rate, variable integration time, dynamic windowing enables tracking during high-rate slewing. In Phase II, we will fabricate a fully-functional 2Kx2K, 12-micron pixel SOI-CMOS star-tracking imagers, and we will perform extensive radiation and reliability testing.

* Information listed above is at the time of submission. *

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