Uncooled, Long-Life Wavefront/Tracking Sensor

Award Information
Agency: Department of Defense
Branch: Missile Defense Agency
Contract: W9113M-06-C-0126
Agency Tracking Number: 044-0096
Amount: $1,250,000.00
Phase: Phase II
Program: SBIR
Awards Year: 2006
Solicitation Year: 2004
Solicitation Topic Code: MDA04-105
Solicitation Number: 2004.4
Small Business Information
VOXTEL, INC.
12725 SW Millikan Way Suite 230, Beaverton, OR, 97005
DUNS: 124348652
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Andrew Huntington
 Senior Engineer
 (971) 223-5646
 andrew@voxtel-inc.com
Business Contact
 George Williams
Title: President
Phone: (971) 223-5646
Email: georgew@voxtel-inc.com
Research Institution
N/A
Abstract
A highly reliable InAlAs/InGaAs avalanche photodiode (APD) focal plane array (FPA) will be developed to replace the electron-bombarded charge-coupled device (EBCCD) camera presently used for Airborne Laser (ABL) wavefront sensing applications. Based on technology with a nominal lifetime of 105 hours of continuous operation, Voxtel’s monolithic solid-state architecture is both more manufacturable and rugged than the existing tube-based instrument. Two innovations lie at the heart of the new wavefront sensor: 1) novel low-noise APD designs and 2) a proprietary readout integrated circuit (ROIC) with extremely low input noise. Development of new APD designs was begun during Phase I, supported by substantial device testing and simulation efforts. A working version of the ROIC already exists and has demonstrated performance characteristics compatible with the wavefront-sensing mission. Building upon this cornerstone, two APD detector designs – one well established and the other more sophisticated – will be manufactured during Phase II. Fabricated as 8×8 FPAs, the low-noise near infrared (NIR) APDs will be characterized and integrated with high bandwidth ROICs in a prototype camera system. The technology readiness of Voxtel’s approach will be demonstrated through performance demonstrations and reliability growth testing.

* information listed above is at the time of submission.

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