Stereoscopic Inspection for Microelectronics Using Multiple Imaging Sensors

Award Information
Agency:
Department of Defense
Branch
Army
Amount:
$69,852.00
Award Year:
1995
Program:
SBIR
Phase:
Phase I
Contract:
n/a
Award Id:
28757
Agency Tracking Number:
28757
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
21414 68th Avenue South, Kent, WA, 98032
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
Dr. Peter H.t. Liu
(206) 872-9500
Business Contact:
() -
Research Institution:
n/a
Abstract
Stereoscopic imaging is a powerful technique that can provide (1) 3D visual inspections (for both surface and interior features), (2) 3D measurements, and (3) 3D defect algorithms. We propose a PC-based microelectronics inspection system that takes advantage of not only stereo imaging, but also multisensor imaging. Method will be developed for obtaining real-time stereo images from X-ray and infrared cameras, both of which are very important for microelectronics. Real-time algorithms will be developed for automatic depth measurement using stereo pairs from a single sensor type. Then the depth information from two or more sensors will be used in conjunction to develop defect recognition algorithms that make use of the added information. We will explore how new signal processing and detection technologies (e.g., neural networks, fuzzy logic, and rule-based systems) can aid in automating microelectronic inspections. Our primary goals for Phase I are to demonstrate stereoscopic 3D imaging of typical microelectronic components on a PC computer, using both X-ray and infrared images, and to produce a System Concept Document that will (a) review current literature and inspection procedures, (b) explore concepts and algorithms for multisensor data fusion, and (c) present a preliminary design for the prototype system to be built during Phase II.

* information listed above is at the time of submission.

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