On-Line Technologies, Inc

Basic Information

87 Church St
East Hartford, CT, 06108

Company Profile

n/a

Additional Details

Field Value
DUNS: n/a
Hubzone Owned: N
Socially and Economically Disadvantaged: N
Woman Owned: N
Number of Employees: n/a


  1. Exhaust Gas Monitoring for Process Control and Pollution Reduction in Semiconductor Manufacturing

    Amount: $69,889.00

    Perfluorocarbons (PFCs), known greenhouse gases, are used widely in semiconductor manufacturing. Several options for reducing the emissions of PFCs are being considered, including: (1) optimizing the ...

    SBIR Phase I 2001 Environmental Protection Agency
  2. N/A

    Amount: $99,983.00

    N/A

    SBIR Phase I 2000 National Science Foundation
  3. N/A

    Amount: $0.00

    N/A

    SBIR Phase I 2000 National Science Foundation
  4. N/A

    Amount: $399,983.00

    N/A

    SBIR Phase II 2000 National Science Foundation
  5. In-Situ, Real-Time Process Control for Micro-Electro-Mechanical System (MEMS) Applications

    Amount: $99,946.00

    N/A

    SBIR Phase I 1999 National Science Foundation
  6. In-Situ Characterization of Photresist Properties by Fourier Trnasform Infrared Based IR Spectroscopy

    Amount: $99,699.00

    N/A

    SBIR Phase I 1999 National Science Foundation
  7. Method & Instrumentation for Thick-Film SOI Non-Destructive Characterization

    Amount: $98,225.00

    N/A

    SBIR Phase I 1999 Air ForceDepartment of DefenseDepartment of Defense
  8. Development of a Cell Controller for Epitaxial Silicon Fabrication

    Amount: $395,521.00

    N/A

    SBIR Phase II 1998 National Science Foundation
  9. A Small, Light, Weight, Low Power, Low Cost, FT-IR Spectrometer

    Amount: $700,000.00

    There are many military, commercial, and medical applications for a small, rugged, and inexpensive infrared (IR) spectrometer. A Fourier Transform Infrared (FT-IR) spectrometer would be an ideal tool ...

    SBIR Phase II 1998 Missile Defense AgencyDepartment of DefenseDepartment of Defense
  10. Real-Time Whole Wafer Thermal Imaging for Semiconductor Process Monitoring

    Amount: $99,898.00

    This program will develop a whole wafer sensor for in situ monitoring and control of temperature during thermally assisted film processes such as rapid thermal processing (RTP), Metallorganic shemical ...

    SBIR Phase I 1998 Air ForceDepartment of DefenseDepartment of Defense

Agency Micro-sites

US Flag An Official Website of the United States Government