Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement unc ...SBIR Phase I 2011 National Institute of Standards and Technology Department of Commerce
Nanometrology International, Inc.
| 302 Woodbridge Ct.
Allen, TX, 75013
|Socially and Economically Disadvantaged:||N|
|Number of Employees:||4|