One-Sided 3D Imaging of Non-Uniformities in Non-Metallic Space Flight Materials

Award Information
Agency: National Aeronautics and Space Administration
Branch: N/A
Contract: NNX11CC67C
Agency Tracking Number: 090069
Amount: $600,000.00
Phase: Phase II
Program: STTR
Awards Year: 2011
Solicitation Year: 2009
Solicitation Topic Code: T7.01
Solicitation Number: N/A
Small Business Information
Picometrix, LLC
MI, Ann Arbor, MI, 48104-6765
DUNS: 788133387
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 David Zimdars
 Principal Investigator
 (734) 864-5639
 dzimdars@picometrix.com
Business Contact
 Marsha Gilbert
Title: Business Official
Phone: (734) 734-5611
Email: mgilbert@picometrix.com
Research Institution
 The Regents of the University of Michigan
 Elaine Brock
 3003 South State Street, Room 1072
Ann Arbor, MI, 48109-1274
 () -
 Nonprofit college or university
Abstract
In this Phase II project, we propose to develop, construct, and deliver to NASA a prototype single-sided computed tomography time-domain terahertz (single-sided CT TD-THz) scanner accessory. This accessory will be suitable to be mounted onto a non-destructive evaluation (NDE) imaging gantry for the single-sided inspection of spacecraft and launch vehicle composite structures. The single-sided CT TD-THz scanner will be an accessory which works with existing T-Ray 4000<SUP>REG</SUP> TD-THz NDE imaging instruments owned by NASA (and other aerospace firms). We will also develop, and deliver a software package which employs the model-based image reconstruction (MBIR) methods. The MBIR method allows the reconstruction of 2D slices in depth from the data acquired by the single-sided CT TD-THz scanner. These 2D slices can then be stacked laterally to generate 3D images of sub-surface structures, features and defects. Time-domain terahertz imaging in the 0.1 to 3 THz spectral range is currently being used to characterize defects in Space Shuttle insulation and related materials. The proposed project will largely be configured from standard Picometrix THz sub-components, but incorporate measurements of the scattered THz fields, enabling full 3D reflection-mode reconstruction of non-metallic materials where only one side is accessible.

* information listed above is at the time of submission.

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