In-Situ Extended Lateral Range Surface Metrology

Award Information
Agency: National Aeronautics and Space Administration
Branch: N/A
Contract: NNX11CF45P
Agency Tracking Number: 104744
Amount: $100,000.00
Phase: Phase I
Program: SBIR
Awards Year: 2011
Solitcitation Year: 2010
Solitcitation Topic Code: S2.05
Solitcitation Number: N/A
Small Business Information
4 D Technology Corporation
3280 East Hemisphere Loop, Suite 146, Tucson, AZ, 85706-5024
Duns: 111037482
Hubzone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Katherine Creath
 Principal Investigator
 (520) 294-5600
 kathy.creath@4dtechnology.com
Business Contact
 Katherine Creath
Title: Senior Research Scientist
Phone: (520) 294-5600
Email: kathy.creath@4dtechnology.com
Research Institution
N/A
Abstract
We propose to develop an extended lateral range capability for a dynamic optical profiling system to enable non-contact, surface roughness measurement of large and aspheric astronomical optics in-situ during manufacture. This instrument will be capable of measuring more than three decades of spatial frequency range for determination of rms surface roughness. It will be insensitive to vibration, being based upon our patented phase-sensor technology, and capable of being mounted on a computer-controlled polishing machine for in-situ measurement of large, aspheric and freeform optics. Objectives for Phase I are to demonstrate a novel automatic alignment system enabling in-situ extended lateral range surface profiling, demonstrate an extended lateral range concept, and to demonstrate a measurement range of more than three decades in spatial frequency. Anticipated results of Phase I will be documented laboratory demonstrations of these capabilities. Our TRL before Phase I is 2-3, after Phase I we anticipate a TRL of 3-4 and after Phase II a TRL of 6.

* information listed above is at the time of submission.

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