An Automated Lapping Apparatus and Process for High- Process for High-Precision Random Profile Roughness Specimen Fabrication

Award Information
Agency:
Department of Commerce
Branch
National Institute of Standards and Technology
Amount:
$89,994.00
Award Year:
2012
Program:
SBIR
Phase:
Phase I
Contract:
SB1341-12-SE-0595
Award Id:
n/a
Agency Tracking Number:
025-68-2012
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
407 Upshire Circle, Gaithersburg, MD, -
Hubzone Owned:
N
Minority Owned:
Y
Woman Owned:
N
Duns:
960861958
Principal Investigator:
DanXiang
(301) 948-8351
dxiang@x-waveinnovations.com
Business Contact:
Research Institute:
n/a
Abstract
The measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests for U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurements. However, the fabrication process develop by a NIST researcher was complicated, which hinders the availability of the SRM specimens. In this proposal, X-wave Innovations, Inc. (XII) proposes an automated lapping apparatus and process, which is based on the idea and claims outlined in NIST’s expired patent, for fabricating the high-precision, random profile roughness specimens. The proposed apparatus and process possess advantages such a high manufacturing throughput, high reproducibility, and low operation cost. The success of this SBIR effort will result in an automated apparatus for manufacturing SRM high-precision, random profile roughness specimens for NIST to support U.S. manufacturing industry.

* information listed above is at the time of submission.

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