Micromachined Probes for Measurement and Characterization of Terahertz Materials and Devices

Award Information
Agency:
Department of Defense
Branch
Army
Amount:
$100,000.00
Award Year:
2012
Program:
STTR
Phase:
Phase I
Contract:
W911NF-13-C-0010
Award Id:
n/a
Agency Tracking Number:
A12A-022-0233
Solicitation Year:
2012
Solicitation Topic Code:
A12a-T022
Solicitation Number:
2012.A
Small Business Information
1027 Stonewood Dr., Charlottesville, VA, -
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
078365518
Principal Investigator:
RobertWeikle
Chief Technology Officer
(434) 996-0102
weikle@dmprobes.com
Business Contact:
ScottBarker
Chief Executive Officer
(434) 962-8221
barker@dmprobes.com
Research Institute:
University of Virginia
Gerald Kane
1001 North Emmet St
PO Box 400195
Charlottesville, VA, 22904-3096
(434) 924-4270

Abstract
The objective of this program is to investigate, develop, and bring to market a robust and reliable probe technology that permits direct, in-situ measurement of devices and materials at frequencies up to 1 THz. Although such measurement capability currently does not exist, it is widely recognized as a critical need for the future development of terahertz devices. Recent advances in silicon micromachining technology at the University of Virginia have resulted in direct-contact on-wafer probes operating to 750 GHz and it is anticipated that this approach is scalable to terahertz frequencies and beyond. Dominion MicroProbes, Inc. is a small business founded by researchers from the University of Virginia working on terahertz technology and is focused on the development application, and commercialization of this micromachined probe technology. Consequently, the primary technical aims of this phase 1 STTR program are (1) to demonstrate the capacity of micromachined direct-contact probes to be extended to terahertz frequencies (2) to exploit the flexibility afforded by micromachining fabrication technology to design robust probe architectures that are suitable for non-standard media and devices, and (3) to generate designs and performance assessments of micromachined probes operating up to 1 THz.

* information listed above is at the time of submission.

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