Defect Reduction Techniques for Large Format Infrared Detector Materials

Award Information
Agency:
Department of Defense
Amount:
$99,916.00
Program:
STTR
Contract:
HQ0147-12-C-7675
Solitcitation Year:
2011
Solicitation Number:
2011.A
Branch:
Missile Defense Agency
Award Year:
2012
Phase:
Phase I
Agency Tracking Number:
B11A-002-0021
Solicitation Topic Code:
MDA11-T002
Small Business Information
IRDT Solutions, Inc
21832 Seacrest Lane, Huntington Beach, CA, -
Hubzone Owned:
N
Woman Owned:
N
Socially and Economically Disadvantaged:
N
Duns:
830609090
Principal Investigator
 Honnavlli Vydyanath
 Chief Scientist
 (714) 717-6675
 hvydyanath@gmail.com
Business Contact
 Honnavlli Vydyanath
Title: President
Phone: (714) 717-6675
Email: hvydyanath@gmail.com
Research Institution
 Rensselaer Polytechnic Institute
 Richard E Scammell
 110 Eigth Street
Troy, NY, 12180-3590
 (518) 276-6281
 Nonprofit college or university
Abstract
Phase I objective is to demonstrate the feasiblility of our proposed approach to minimize the defect and dislocation size and densities in Si substrate based HgCdTe epitaxial layers with a cut off wavelength of ~10 microns at 77 K. Phase II effort will validate our approach with demonstration of large area Si substrate based HgCdTe epitaxial layers with area in excess of 25 cm2 and in addition demonstrate FPAs in large array formats with state of the art performance in these epitaxial layers.

* information listed above is at the time of submission.

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