Complete Characterization of Ultrafast X-Ray Pulses

Award Information
Agency: Department of Energy
Branch: N/A
Contract: DE-FG02-11ER90080
Agency Tracking Number: 97101
Amount: $997,562.00
Phase: Phase II
Program: SBIR
Awards Year: 2012
Solicitation Year: 2012
Solicitation Topic Code: 12 d
Solicitation Number: DE-FOA-0000676
Small Business Information
1550 Pacheco St, Santa Fe, NM, 87505-3914
DUNS: 607619223
HUBZone Owned: Y
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Daniel Kane
 (505) 216-5015
Business Contact
 Daniel Kane
Title: Dr.
Phone: (505) 216-5015
Research Institution
We are improving critical technologies needed for the development of laser-driven, table-top ultrafast x-ray sources suitable for ultrafast characterization of transient structures of energized molecules undergoing dissociation, isomerization, or intramolecular energy redistribution. In this SBIR project, Mesa Photonics will develop an X-ray ultrafast laser pulse measurement instrument for complete characterization of femtosecond to picosecond X-ray sources. This technology is critical for the development, control, and efficiency of table-top ultrafast x-ray sources as well as free electron-based sources. In Phase I, we demonstrated our technology for ultrafast X-ray pulse measurement by showing that it will be capable of measuring ultrafast X-ray pulses as short as 20 fs. We also developed new analysis methods that we were able to productize. The Phase II effort will continue with the development of our ultrafast X-ray pulse measurement technology. We will demonstrate the pulse measurement capability on different energy X-ray pulses and different time durations, and develop a single-shot, high speed version for real-time monitoring. Commercial Applications and Other Benefits: Low cost, efficient, coherent x-ray sources will improve medical imaging and diagnosis. Improved imaging for Homeland Security will result in safer ports and airports. These systems can also be used for non-destructive testing, microanalysis, and microscopy.

* Information listed above is at the time of submission. *

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