Innovative Computational Mitigation of Radiation Effects in Nano-technology Microelectronics

Award Information
Agency:
Department of Defense
Branch
n/a
Amount:
$150,000.00
Award Year:
2012
Program:
SBIR
Phase:
Phase I
Contract:
HDTRA1-12-P-0009
Award Id:
n/a
Agency Tracking Number:
T103-002-0050
Solicitation Year:
2010
Solicitation Topic Code:
DTRA103-002
Solicitation Number:
2010.3
Small Business Information
18378 Redmond Fall CIty Road, Redmond, WA, -
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
010947088
Principal Investigator:
Lili Zhou
Senior Member of Technical Staff
(425) 702-9196
lili.zhou@orora.com
Business Contact:
Tracey Luo
Board Director
(425) 702-9196
tracey.luo@orora.com
Research Institution:
Stub




Abstract
Orora Design Technologies, Inc. proposes to develop an innovative computer-aided design (CAD) based methodology and enabling tools for rapid radiation-hardened prototyping and migration of military satellite microelectronics. A key innovative tool to be explored is automated generation and validation of behavioral models for complex analog, digital and mixed-signal circuits, including radiation effects, that offers 100-1000x faster than the state-of-art. This allows the modeling of device reliability in the target---often finer feature sized---process that is different from the obsolescent process. The second innovation is to develop an optimization-based design tool that reads the design data base of an obsolescent part (GDS-II layout for analog and mixed-signal circuits), extracting automatically the circuit functionality as well as design constraints, radiation-hardening circuitry, and then re-optimizes and generates automatically a new design for the target fabrication process to meet the form, packaging, function, power and timing requirements; this parallels re-synthesis using radiation-hardened standard cell libraries for digital functionalities. This methodology will be demonstrated, together with Boeing Solid-State Electronics Development, by automated synthesis and migration of a commonly used class of satellite microcircuits and characterizing for radiation hardness, operating temperature range, functionality and reliability.

* information listed above is at the time of submission.

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