Ink Jet Printing of High Performance SWIR Imagers

Award Information
Agency:
Department of Defense
Amount:
$149,999.00
Program:
SBIR
Contract:
H92222-12-P-0068
Solitcitation Year:
2012
Solicitation Number:
2012.1
Branch:
N/A
Award Year:
2012
Phase:
Phase I
Agency Tracking Number:
S121-002-0104
Solicitation Topic Code:
SOCOM12-002
Small Business Information
Voxtel Inc.
15985 NW Schendel Avenue, Suite 200, Beaverton, OR, -
Hubzone Owned:
N
Woman Owned:
N
Socially and Economically Disadvantaged:
N
Duns:
124348652
Principal Investigator
 David Schut
 Senior Scientist
 (971) 223-5646
 david@voxtel-inc.com
Business Contact
 George Williams
Title: President
Phone: (971) 223-5646
Email: georgew@voxtel-inc.com
Research Institution
 Stub
Abstract
A full, wafer scale nanocrystal detector technology will be used to fabricate compact, light weight, low power, low cost short-wavelength infrared (SWIR) sensors. This approach is based on integration of inorganic nanocrystal films with large-format, small-pixel-pitch CMOS readout integrated circuits (ROICs). Using solution processing, the nanocrystal films can be printed directly onto ROICs, allowing high resolution (e.g.<10µm pitch) focal planes to be realized at low cost, without the need for indium bump bonding. In Phase I, a series of SWIR sensitive nanocrystals will be developed, optimized with inorganic ligands, and short wavelength infrared (SWIR) sensitive films will be analytically characterized. The films will be integrated with high resolution readout integrated circuits (ROICs) and the optical performance of fully-functional SWIR imagers will be demonstrated. In Phase II, the performance of the detectors will be optimized and large format, high pixel density imagers will be fabricated, field tested, and reliability tested.

* information listed above is at the time of submission.

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