An External Store Carriage Life Assessment and Monitoring System

Award Information
Agency:
Department of Defense
Branch
n/a
Amount:
$79,990.00
Award Year:
2012
Program:
SBIR
Phase:
Phase I
Contract:
N68936-12-C-0088
Award Id:
n/a
Agency Tracking Number:
N112-094-0583
Solicitation Year:
2011
Solicitation Topic Code:
N112-094
Solicitation Number:
2011.2
Small Business Information
Sporian Microsystems, Inc. (Currently SPORIAN MICROSYSTEMS INC)
515 Courtney Way - Suite B, Lafayette, CO, -
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
128688111
Principal Investigator:
Brian Schaible
President
(303) 516-9075
brian@sporian.com
Business Contact:
Michael Usrey
VP of Business Developmen
(303) 516-9075
musrey@sporian.com
Research Institution:
Stub




Abstract
At present, aircraft external stores are designed for, and qualified to, a particular carriage life based in part on exposure to vibration and shock events. However, there currently is no acceptable method for tracking the exposure of individual stores to sustained vibration or other inertial events. The is a need for a device that can be integrated into external stores to monitor and track exposure of the store to vibration and mechanical shock events such as total time in steady or maneuvering flight, adjacent weapons firings, arrested landings, etc. Sporian proposes to develop a sensor that can measure accelerations of the store in three axes and automatically identify, categorize, and track exposure to inertial inputs of interest. The overall concept for the proposed system is based on an ultra-low power 3-axis accelerometer and novel signal conditioning circuitry plus wireless communications and energy harvesting technology to generate data that supports tracking of total carriage time plus other selected inertial events of interest. Phase I efforts will focus on defining the sensor and overall system requirements, evaluating competing sensor and system options, developing an initial design for the sensor, and prototyping and demonstrating critical aspects of the sensor in a laboratory environment.

* information listed above is at the time of submission.

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