An Automated Lapping Apparatus and Process for High-Precision Random Profile Roughness Specimen Fabrication

Award Information
Agency:
Department of Commerce
Branch
National Institute of Standards and Technology
Amount:
$300,000.00
Award Year:
2013
Program:
SBIR
Phase:
Phase II
Contract:
SB1341-13-CN-0036
Award Id:
n/a
Agency Tracking Number:
025-68-2013
Solicitation Year:
2012
Solicitation Topic Code:
9.02.02-68-TT
Solicitation Number:
n/a
Small Business Information
407 Upshire Circle, Gaithersburg, MD, 20878-
Hubzone Owned:
N
Minority Owned:
Y
Woman Owned:
N
Duns:
960861958
Principal Investigator:
Dan Xiang
(301) 948-8351
Business Contact:
Research Institute:
n/a
Abstract
The measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests from U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurements. X-wave Innovations, Inc. (XII) proposes an automated lapping apparatus and process for fabricating the high-precision, random profile roughness specimens. The proposed apparatus and process possess advantages such as high manufacturing throughput, high reproducibility, and low operation cost. The success of this SBIR effort will result in an automated apparatus for manufacturing SRM high-precision, random profile roughness specimens for NIST to support U.S, manufacturing industry.

* information listed above is at the time of submission.

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