A Compact Sensor with Multiple In-Situ Sensing Capabilities

Award Information
Agency: National Aeronautics and Space Administration
Branch: N/A
Contract: NNX13CA36P
Agency Tracking Number: 125041
Amount: $124,976.00
Phase: Phase I
Program: SBIR
Awards Year: 2013
Solicitation Year: 2012
Solicitation Topic Code: S1.07
Solicitation Number: N/A
Small Business Information
CA, Fremont, CA, 94539-7750
DUNS: 092885990
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Pengfei Wu
 Chief Scientist
 (510) 445-0833
Business Contact
 Suning Tang
Title: Business Official
Phone: (510) 445-0833
Email: tangsuning@eocrystal.com
Research Institution
Planetary rocks, soils, liquids and atmospheric gases are ideal targets for scientists to study the possibility of life existence and the habitability, nature and evolution of planetary systems. Currently, NASA uses different sensing technologies to analyze planetary samples. The use of multiple instruments increases the weight, complexity, power consumption as well as the probability of system malfunction. It is critical to develop lightweight miniaturized multi-functional sensor to enable NASA's multiple-mission needs and therefore make the best use of limited resources by reducing the cost, size, and the number of instruments. Crystal Research Inc. (CRI) proposes a novel compact optical sensor with multiple in-situ sensing capabilities for measurements of various inorganic and organic samples for planetary study and search of biomarkers. The proposed technique is based on a nonlinear coherent interaction process to detect the backward spectral signals from the targets. The detection is enabled by using our novel electro-optic (EO) switchable spectral filtering technique to eliminate spectral artifacts and nonresonant background. The standoff scheme facilitates the implementation of multiple measurements by using a single sensor for nondestructive analysis of different samples on land surface or in atmosphere. It eliminates the sample preparation process, contamination and other related accessories.

* Information listed above is at the time of submission. *

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