A technique to measure the electric charge on the mesa sidewalls of small infrared detector pixels

Award Information
Agency: Department of Defense
Branch: Army
Contract: W909MY-13-C-0018
Agency Tracking Number: A131-042-0899
Amount: $100,000.00
Phase: Phase I
Program: SBIR
Awards Year: 2013
Solicitation Year: 2013
Solicitation Topic Code: A13-042
Solicitation Number: 2013.1
Small Business Information
QmagiQ, LLC
22 Cotton Road, Unit H, Suite 180, Nashua, NH, -
DUNS: 168454770
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Mani Sundaram
 CEO
 (603) 821-3092
 msundaram@qmagiq.com
Business Contact
 Axel Reisinger
Title: CTO
Phone: (603) 821-3092
Email: areisinger@qmagiq.com
Research Institution
 Stub
Abstract
We propose a simple and elegant technique to directly measure the electric charge on the surfaces of small pixels of III-V and II-VI infrared detectors. Such charges arise from minority-carrier inversion or majority-carrier accumulation layers caused by surface states and exist as 2-dimensional electron or hole gases on the mesa sidewalls. They cause surface current leakage down the sidewalls that dominate the dark current in small pixels. Quantifying the effect of different passivation techniques on surface electric charge is crucial to minimizing sidewall leakage current. In Phase I, we will develop and demonstrate the viability of our measurement technique. In Phase II, we will develop an instrument and study a variety of passivation techniques with the goal of eliminating sidewall leakage in small pixels of Type-II InAs/GaSb strained layer superlattice photodiodes.

* information listed above is at the time of submission.

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