A technique to measure the electric charge on the mesa sidewalls of small infrared detector pixels

Award Information
Agency:
Department of Defense
Branch
Army
Amount:
$100,000.00
Award Year:
2013
Program:
SBIR
Phase:
Phase I
Contract:
W909MY-13-C-0018
Agency Tracking Number:
A131-042-0899
Solicitation Year:
2013
Solicitation Topic Code:
A13-042
Solicitation Number:
2013.1
Small Business Information
QmagiQ, LLC
22 Cotton Road, Unit H, Suite 180, Nashua, NH, -
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
168454770
Principal Investigator:
Mani Sundaram
CEO
(603) 821-3092
msundaram@qmagiq.com
Business Contact:
Axel Reisinger
CTO
(603) 821-3092
areisinger@qmagiq.com
Research Institution:
Stub




Abstract
We propose a simple and elegant technique to directly measure the electric charge on the surfaces of small pixels of III-V and II-VI infrared detectors. Such charges arise from minority-carrier inversion or majority-carrier accumulation layers caused by surface states and exist as 2-dimensional electron or hole gases on the mesa sidewalls. They cause surface current leakage down the sidewalls that dominate the dark current in small pixels. Quantifying the effect of different passivation techniques on surface electric charge is crucial to minimizing sidewall leakage current. In Phase I, we will develop and demonstrate the viability of our measurement technique. In Phase II, we will develop an instrument and study a variety of passivation techniques with the goal of eliminating sidewall leakage in small pixels of Type-II InAs/GaSb strained layer superlattice photodiodes.

* information listed above is at the time of submission.

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