VLWIR HgCdTe FPA Reliability and Yield Enhancement through Nanostructural Analysis

Award Information
Agency:
Department of Defense
Branch
Missile Defense Agency
Amount:
$983,746.00
Award Year:
2010
Program:
SBIR
Phase:
Phase II
Contract:
W9113M-11-C-0007
Agency Tracking Number:
B083-013-0055
Solicitation Year:
2008
Solicitation Topic Code:
MDA08-013
Solicitation Number:
2008.3
Small Business Information
NanoTEM
9375 E. Shea Blvd., Ste. 100, Scottsdale, AZ, 85260
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
Fred Shaapur
Principal Scientist
(602) 243-5374
info@nanotem.com
Business Contact:
Roger Graham
Principal Scientist
(602) 243-5374
info@nanotem.com
Research Institution:
n/a
Abstract
The state-of-the-art FPA manufacturing technologies commonly generate some critical defects in the pixel elements, which adversely impact their operability and reliability. In Phase I, the feasibility of identifying, analyzing, and on exemplary basis, eliminating these defects indirectly through nanostructural analysis was demonstrated. In Phase II, this defect analysis and correlation approach will be integrated with the FPA manufacturing technology to be able to eliminate critical structural defects effectively and efficiently at any FPA foundry. Once these structural defects have been removed, one could conceivably expect an FPA component to deliver its optimal performance as per intended design specifications. Furthermore, the resulting intra-array and inter-array reproducibility of the pixel elements will ensure minimal variability of the FPAs fabricated through the same baseline manufacturing process.

* information listed above is at the time of submission.

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