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Characterization of Multilayer Coatings Using Shaped Field Electromagnetic Sensor Arrays

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8650-10-M-5109
Agency Tracking Number: F093-113-2244
Amount: $99,929.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: AF093-113
Solicitation Number: 2009.3
Timeline
Solicitation Year: 2009
Award Year: 2010
Award Start Date (Proposal Award Date): 2009-12-23
Award End Date (Contract End Date): 2010-09-30
Small Business Information
110-1 Clematis Avenue
Waltham, MA 02453
United States
DUNS: 018791827
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Yanko Sheiretov
 Principal Investigator
 (781) 642-9666
 jentek@shore.net
Business Contact
 Joni Hatem
Title: Sr. Vice President
Phone: (781) 642-9666
Email: jhatem@primushost.com
Research Institution
N/A
Abstract

In this program we will develop the capability to rapidly characterize, over large areas, the properties of multi-layer coatings used in specialized aircraft for electrostatic and electromagnetic integrity. The measured coating properties will be the thickness of the conducting layer, the conductivity and/or magnetic permeability of the conducting layer, and the thickness of the nonconducting transition and topcoat layers. At the core of the proposed approach are JENTEK’s MWM-Arrays, which are inductive, eddy-current-based sensors, fabricated on conformable flexible substrates, and JENTEK’s multivariate inverse methods, used to obtain simultaneous and independent estimates of multiple unknown material properties from MWM-Array measurements. This proposed technology has several substantial advantages over existing inspection methods: (1) the MWM-Arrays are operated in scanning mode, producing spatially registered, two-dimensional (C-scan) digital images of coating properties over large areas in real time; (2) no reference standards are required; (3) information is provided on multiple material properties in a single pass. Northrop Grumman Aerospace Systems (NGAS) will support JENTEK in the performance of this proposed Phase I program. BENEFIT: If this program is successful, the Air Force would be provided with a tool to detect and image the thickness of individual layers of a multi-layer coating stack and the electromagnetic properties of the conducting layer. This would reduce maintenance costs and improve fleet readiness and mission capability. The commercial market for characterization of multi-layered coatings is substantial, including commercial aerospace, spacecrafts, and corrosion protection systems.

* Information listed above is at the time of submission. *

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