Electronic Component Fingerprinting to Determine Manufacturing Origin

Award Information
Agency:
Department of Defense
Branch
Defense Advanced Research Projects Agency
Amount:
$999,014.00
Award Year:
2014
Program:
SBIR
Phase:
Phase II
Contract:
W911NF-14-C-0040
Award Id:
n/a
Agency Tracking Number:
D2-1274
Solicitation Year:
2013
Solicitation Topic Code:
SB133-003
Solicitation Number:
2013.3
Small Business Information
7702 E. Doubletree Ranch Rd., Ste. 300, Scottsdale, AZ, 85258
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
000000000
Principal Investigator:
Fred Shaapur
President
(602) 410-5840
fshaapur@nanotem.com
Business Contact:
Kerry Bernstein
program manager
(703) 526-2117
kerry.bernstein@darpa.mil
Research Institution:
n/a
Abstract
In the area of supply chain integrity improvement, the US defense and intelligence sectors anticipate multiple uses for the forensic capability to characterize an electronic component for the purpose of identifying the semiconductor fabrication facility where the component was manufactured. In this Direct-to-Phase II effort, FabMetrix (formerly NanoTEM) proposes to expand an existing Department of Defense SBIR-developed diagnostic technology to offer such manufacturing forensic capability by leveraging its key components of nanoscale structural, compositional, mechanical and electrical characterization methodologies. The required expansion of this transmission electron microscopy-based technology will be carried out through: (a) identification, extraction and exploitation of suitable physical parametrics as manufacturer-specific fingerprints, and (b) generation, compilation and optimization of reference manufacturer-specific fingerprint libraries as the basis for the above capability.

* information listed above is at the time of submission.

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