You are here
Fragmentation Data Collection and Analysis for JMEMs Arena Tests
Title: Principal Investigator
Phone: (256) 656-2932
Phone: (256) 651-5673
FreEnt Technologies, Inc. proposes to combine Synthetic Aperture Array (SAR) and Electromagnetic Induction (EMI) technologies to develop a witness panel scanning system, which we call the Automated Fragmentation Data Collection System (AFDCS) to meet the needs of AMRDEC testing debris and fragment characterization requirements. The baseline concept consists of a table of frame for placement of Celotex witness bundles containing fragments and debris, and a scanner-head mounted on adjustable rails above the table/frame and driven by electric positioners to propel it along the rails at a constant (or stepped) speed. The scanner-head consists of a SAR array of small high-frequency Ultra-Wideband radar antennas and associated transceivers for determining fragment location, size, and shape, and an array of small Low-Frequency (LF) induction transceiver coils for detection of metals and metal classification. The LF EMI arrays are used to discriminate metal types using a frequency domain technique. The combined SAR and EMI sensor data is fused to obtain the location size, shape, material and estimated mass of the imbedded fragments. Other applications include: catastrophic event forensics, such as building structural failure and fire forensics, aircraft accident investigations, and investigations of explosions due to accident, criminal, or terrorist acts.
* Information listed above is at the time of submission. *