Structured Waveform, Magnetic Field (SWMF) PIG Development for Cracks and Corrosion

Award Information
Agency: Department of Transportation
Branch: N/A
Contract: DTRT5714C10015
Agency Tracking Number: DTRT5714C10015
Amount: $149,931.58
Phase: Phase I
Program: SBIR
Solicitation Topic Code: 132PH1
Solicitation Number: DTRT5713RSBIR2
Timeline
Solicitation Year: 2013
Award Year: 2014
Award Start Date (Proposal Award Date): 2014-02-04
Award End Date (Contract End Date): 2014-08-04
Small Business Information
110-1 Clematis Ave., Waltham, MA, 02453-7013
DUNS: 18791827
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Brian Manning
 Mechanical Engineering
 (781) 373-9725
 brain.manning@jenteksensors.com
Business Contact
 Joni Hatem
Title: Sr. Vice President
Phone: (781) 373-9706
Email: joni.hatem@jenteksensors.com
Research Institution
N/A
Abstract
Multiple major pipeline failures have been caused by seam weld defects not detected by available ILI technology [August 16, 2013 WSJ]. Phase I will demonstrate a game changing capability to deliver internal and external corrosion mapping and seam weld crack detection in a low-cost tool that “encourages more repetitive ILI runs and wider use.” JENTEK’s new through wall imaging method called SWMF is capable of inspecting at production flow speeds up to 15 m/s. SWMF along with the novel MR-MWM-Array construct, parallel architecture electronics, and HyperLattice (precomputed database)-based multivariate inverse methods (MIMs) will enable imaging of defects at high data rates without controlling lift-off (proximity to the internal pipe surface). This MIM approach enables independent imaging of wall thickness and longitudinal magnetic permeability, as well as differentiation of internal vs. external defects. Magnetic permeability is correlated with stress to assess the longitudinal strain and post weld heat treatment performance. The primary focus of Phase I will be on transverse & longitudinal cracks and internal & external corrosion.

* Information listed above is at the time of submission. *

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