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Particle Sizing and Identification Through Advanced Light Scatter Techniques

Award Information
Agency: Department of Commerce
Branch: N/A
Contract: 257
Agency Tracking Number: 30908
Amount: $198,981.00
Phase: Phase II
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Solicitation Year: N/A
Award Year: 1996
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
77 Rowe Street, Newton, MA, 02166
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 John Stoyer
 Project Manager
 () -
Business Contact
Phone: () -
Research Institution
Light scatter has been used to map and size particles on silicon wafers for many years, producing accurate maps of particle position and giving an indication of particle size, but do not reveal any information about particle composition. Today's technology is limited by noise, precluding detection of the smallest particles of interest. Present instruments are not adequate for the next generation of semiconductor devices. Experimental and theoretical studies indicate that more information can be obtained from light scattered by particles than is presently being utilized. Through a combination of measurements and modeling, it should be possible to identify an optimum configuration (geometry, wavelength, polarization, etc.) for a scattering instrument. Work includes experimental verification of theoretical scatter models, noise analysis, development of numerical models, selection of potential instrument configurations, comparison and optimization of configurations and development of specifications for a prototype instrument. If successful, this approach will lead to a prototype instrument capable of detecting and classifying particles as small as 0.06 um on silicon wafers. This will support the goals of the National Technology Roadmap for Semiconductors through the 0.18 um process generation.

* Information listed above is at the time of submission. *

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