A REAL-TIME X-RAY DETECTOR

Award Information
Agency:
Department of Energy
Branch
n/a
Amount:
$500,000.00
Award Year:
1993
Program:
SBIR
Phase:
Phase II
Contract:
n/a
Agency Tracking Number:
17651
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
Advanced Technology Materials
7 Commercial Drive, Danbury, CT, 06810
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
Mr. David Kurtz
() -
Business Contact:
Mr. Daniel P. Sharkey
(203) 794-1100
Research Institution:
n/a
Abstract
IN-SITU MONITORING OF CRITICAL MATERIAL PROPERTIES WOULD GREATLY ENHANCE PROCESS CONTROL OF A WIDE VARIETY OF MANUFACTURING TECHNOLOGIES. POSITION SENSITIVE FIBER OPTIC X-RAY SCINTILLATION DETECTORS (PSSD) CAN BE USED TO SIMULTANEOUSLY MEASURE SEVERAL CRITICAL SOLID POLYCRYSTALLINE MATERIAL PARAMETERS SUCH AS THICKNESS, CRYSTAL STRUCTURE, CRYSTAL PERFECTION, PREFERRED ORIENTATION, AND RESIDUAL STRESS. COMPARED WITH TRADITIONAL X-RAY DETECTORS, THE PSSD SYSTEM IS VERY COMPACT, REQUIRES NO SCANNING, AND-MOST IMPORTANTLY-HAS VERY RAPID SAMPLING TIME (LESS THAN 1 SECOND). ALL THESE ATTRIBUTES MAKE IT IDEALLY SUITED FOR REAL-TIME ANALYSIS. THIS PHASE I PROJECT ADDRESSES, IN CONJUNCTION WITH PENNSYLVANIA STATE UNIVERSITY, THE DEVELOPMENT OF A REAL-TIME X-RAY DETECTOR FOR USE IN HARSH ENVIRONMENT COATING SYSTEMS. IN PHASE II, THE PSSD X-RAY MONITOR WILL BE INCORPORATED INTO MANUFACTURING PROCESSES FOR FEEDBACK PROCESS CONTROL.

* information listed above is at the time of submission.

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