DEVELOPMENT OF A BENCH TOP INSTRUMENT FOR MEASURING HIGH TEMPERATURE SURFACE EMISSIVITY

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: N/A
Agency Tracking Number: 8247
Amount: $250,000.00
Phase: Phase II
Program: SBIR
Awards Year: 1990
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
Advanced Fuel Research Inc.
Po Box 18343 - 87 Church St, East Hartford, CT, 06118
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Peter R Solomon
 (203) 528-9806
Business Contact
Phone: () -
Research Institution
N/A
Abstract
FOR SURFACES AT HIGH TEMPERATURE THE EMITTED SPECTRUM OF ELECTROMAGNETIC RADIATION IS THE MOST CONVENIENT PROBE OF TEMPERATURE, IF THE SPECTRAL EMITTANCE OF THE SAMPLE IS KNOWN. THIS PROPOSAL SUGGESTS THE APPLICATION OF FOURIER TRANSFORM (FT) SPECTROSCOPY TO THE MEASUREMENT OF SPECTRAL EMITTANCE. THE OBJECTIVE OF PHASE I IS TO DEMONSTRATE THE DETERMINATION OF SPECTRAL EMITTANCE EMPLOYING A FI-IR SPECTROMETER COUPLED TO A MODERATE TEMPERATURE FURNACE. MEASUREMENTS WOULD BE MADE OF THE RADIANCE FROM SAMPLES IN A THIN WALL FURNACE AND OF THE INTEGRATED SPECULAR AND DIFFUSE REFLECTION IN A MORE CONVENTIOAL FURNACE. THE RESULTS OF THE TWO METHODS WILL BE COMPARED AND THE ERRORS CONSIDERED. MEASUREMENTS WOULD BE MADE AT TEMPERATURES UP TO 2000 DEG R BETWEEN 1.7 AND 20 MICRONS AND NEARLY NORMAL INCIDENCE. IN PHASE II, AN INSTRUMENT WILL BE CONSTRUCTED BASED ON THE RESULTS OF THE TWO METHODS. AMONG THE CONCEPTS TO BE CONSIDERED FOR THE FINAL DESIGN ARE THE USE OF BOTH REFLECTION AND EMISSION MEASUREMENTS. THE REFLECTION METHOD WOULD DETERMINE THE SPECTRAL EMITTANCE ON A HOT SAMPLE WHOSE TEMPERATURE, AT THE MEASUREMENT POINT, MAY BE IMPRECISELY KNOWN. THE EMISSION MEASUREMENT, MADE SIMULTANEOUSLY WOULD DETERMINE THE TEMPERATURE, BASED ON THE MEASURED SPECTRAL EMITTANCE. THE PHASE II PROGRAM WOULD RESULT IN AN INTEGRATED, AUTOMATED, BENCH TOP, RESEARCH PROTOTYPE INSTRUMENT FOR EVALUATION.

* information listed above is at the time of submission.

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