IN-SITU DIAGNOSTICS FOR DEPOSITION OF HIGH T SUPERCONDUCTING FILMS

Award Information
Agency:
Department of Defense
Branch
Missile Defense Agency
Amount:
$292,000.00
Award Year:
1990
Program:
SBIR
Phase:
Phase II
Contract:
n/a
Award Id:
8249
Agency Tracking Number:
8249
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
Po Box 18343 - 87 Church St, East Hartford, CT, 06118
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
Dr David G Hamblen
(203) 528-9806
Business Contact:
() -
Research Institution:
n/a
Abstract
A RENEWED INTEREST IN THE APPLICATIONS OF SUPERCONDUCTIVITY HAS RESULTED FROM THE RECENT DISCOVERY OF PEROVSKITE-LIKE COPPER-OXIDE SUPERCONDUCTORS WITH TRANSITION TEMPERATURES ABOVE LIQUID NITROGEN TEMPERATURES. ALTHOUGH THE THIN FILMS AS DEPOSITED GENERALLY HAVE THE APPROPRIATE Y:BA:CU STOICHIOMETRY, A SUBSEQUENT HIGH TEMPERATURE (T>900 DEGREE CELCIUS) OXYGEN TREATMENT IS REQUIRED TO ACHIEVE THE CORRECT OXYGEN CONCENTRATION AND THE REQUIRED ORTHORHOMBIC CRYSTAL STRUCTURES. IN THIS STUDY, MONITORING TECHNIQUES ARE BEING DEVELOPED BY COUPLING IN-SITU DIAGNOSTICS WITH A UNIQUE LASER ABLATION TECHNIQUEFOR DEPOSITING FILM. TECHNIQUES BEING EVALUATED INCLUDE RAMAN, X-RAY TRANSFORM INFRARED (FT-IR) SPECTROSCOPIES. THIN FILM SAMPLES OF COPPERDIFFRACTION, AND FOURIER TRANSFORM INFRARED (FT-IR) SPECTROSCOPIES. THIN FILM SAMPLES OF COPPER OXIDE PEROVSKITE MATERIALS ARE BEING ANALYZED IN BOTH THE UNANNEALED, NON-SUPERCONDUCTING AND THE ANNEALED,SUPERCONDUCTING STATE USING THE ABOVE TECHNIQUES AT ROOM TEMPERATURE IN ORDER TO ESTABLISH BASELINE DATA. IN ADDITION, FT-IR EMISSION AND DIFFUSE REFLECTANCE TECHNIQUES ARE BEING USED TO MONITOR THE DEPOSITION PROCESS IN-SITU. WHEN SUCCESSFULLY DEMONSTRATED, THE FIRSTAPPLICATION OF THESE PRESENT MATERIALS (WHICH ARE GRANULAR) IS LIKELY TO BE IN THE AREA OF MICROELECTRONICS (IR DETECTORS, SUPERCONDUCTING INTERCONNECTS) RATHER THAN LARGER APPLICATIONS REQUIRING DUCTILE WIRES.

* information listed above is at the time of submission.

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