Improved Silicon Drift Detector Coincidence Rejection for Digital Pulse Processors

Award Information
Agency:
Department of Commerce
Branch
National Institute of Standards and Technology
Amount:
$90,000.00
Award Year:
2008
Program:
SBIR
Phase:
Phase I
Contract:
SB1341-08-SE-0661
Agency Tracking Number:
313-08
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
4pi Analysis, Inc.
3500 Westgate Dr., Suite 403, Durham, NC, 27707
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
Stefan Jeglinski
(919) 489-1757
jeglin@4pi.com
Business Contact:
() -
Research Institution:
n/a
Abstract
The recent emergence of the Silicon Drift detector (SDD), for use in Energy Dispersive x-ray Spectroscopy (EDS), has made possible x-ray event streams with input count rates in the range of 1-10 Mcps. Modern digital pulse processors are therefore required to run at fast time constants to achieve reasonable throughput; however, this causes significant coincidence artifacts to appear in the spectrum, thus complicating analysis. Phase I will design and demonstrate an improved coincidence rejection system based on 4pi's digital pulse processor development, and earlier pulse-shape analysis and recovery research.

* information listed above is at the time of submission.

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