Improved Silicon Drift Detector Coincidence Rejection for Digital Pulse Processors
Small Business Information
4pi Analysis, Inc.
3500 Westgate Dr., Suite 403, Durham, NC, 27707
AbstractThe recent emergence of the Silicon Drift detector (SDD), for use in Energy Dispersive x-ray Spectroscopy (EDS), has made possible x-ray event streams with input count rates in the range of 1-10 Mcps. Modern digital pulse processors are therefore required to run at fast time constants to achieve reasonable throughput; however, this causes significant coincidence artifacts to appear in the spectrum, thus complicating analysis. Phase I will design and demonstrate an improved coincidence rejection system based on 4pi's digital pulse processor development, and earlier pulse-shape analysis and recovery research.
* information listed above is at the time of submission.