Improved Silicon Drift Detector Coincidence Rejection for Digital Pulse Processors

Award Information
Agency: Department of Commerce
Branch: National Institute of Standards and Technology
Contract: SB1341-08-SE-0661
Agency Tracking Number: 313-08
Amount: $90,000.00
Phase: Phase I
Program: SBIR
Awards Year: 2008
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
3500 Westgate Dr., Suite 403, Durham, NC, 27707
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Stefan Jeglinski
 (919) 489-1757
Business Contact
Phone: () -
Research Institution
The recent emergence of the Silicon Drift detector (SDD), for use in Energy Dispersive x-ray Spectroscopy (EDS), has made possible x-ray event streams with input count rates in the range of 1-10 Mcps. Modern digital pulse processors are therefore required to run at fast time constants to achieve reasonable throughput; however, this causes significant coincidence artifacts to appear in the spectrum, thus complicating analysis. Phase I will design and demonstrate an improved coincidence rejection system based on 4pi's digital pulse processor development, and earlier pulse-shape analysis and recovery research.

* Information listed above is at the time of submission. *

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