X-RAY INSTRUMENTATION FOR IMPROVED SEMICONDUCTOR MANUFACTURING PRODUCTIVITY

Award Information
Agency: National Science Foundation
Branch: N/A
Contract: N/A
Agency Tracking Number: 7453
Amount: $224,999.00
Phase: Phase II
Program: SBIR
Awards Year: 1989
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
425 Lakeside Drive, Sunnyvale, CA, 94086
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Louis Koppel
 () -
Business Contact
Phone: () -
Research Institution
N/A
Abstract
RESEARCH ON UNIQUE SOFT X-RAY WAVE-LENGTH DISPERSIVE INSTRUMENTATION IS PROPOSED TO FULFILL IMPORTANT PROCESS MONITOR NEEDS IN THE SEMICONDUCTOR INDUSTRY. ARACOR EXPERIENCE IN DESIGNING AND SUCCESSFULLY APPLYING MULTILAYER SYNTHETIC MICROSTRUCTURES TO OBTAIN BOTH WAVE-LENGTH DISCRIMINATION AND FOCUSING OF SOFT X-RAYS IS UTILIZED AS A KEY PART OF THIS WORK. THIS PROPOSAL DETAILS HOW THE NOVEL X-RAY OPTIC ELEMENTS PROVIDE LARGE SOLID-ANGLE COLLECTION EFFICIENCY AND FOCUSING OF FLUORESCENT SOFT X-RAYS TO YIELD QUANTITATIVE, NON-DESTRUCTIVE MEASUREMENT OF ELEMENTAL MATERIALS WITHIN MEASUREMENT TIMES OF ONE TO TWO SECONDS INSTEAD OF MINUTES AS FOR X-RAY ENERGY-DISPERSIVE INSTRUMENTS. THE RAPIDITY OF MEASUREMENT ALLOWS APPLICATION AS A PROCESS LINE MONITOR WITH THE CAPABILITY OF UNAMBIGUOUSLY DETERMINING THE ELEMENTAL CONCENTRATIONS ACROSS THE WAFER SURFACE. A UNIQUE AND EXTREMELY SIGNIFICANT APPLICATION WHICH COMES DIRECTLY FROM HIGH FLUX COUNTING IS THE ABILITY TO DETERMINETHE PROJECTED RANGE OF ION IMPLANTED SPECIES. THE PROPOSED RESEARCH IN PHASE I IS PRIMARILY THEORETICAL, WITH MAJOR EMPHASIS ON DETERMINING THE PARAMETERS CHARACTERIZING THE MULTILAYER SYNTHETIC MICROSTRUCTURES. THE FINAL RESULT TO BE OBTAINED IN PHASE I IS THE DESIGN OF A CHARACTERIZED PROTOTYPE INSTRUMENT.

* Information listed above is at the time of submission. *

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