NEW-TECHNOLOGY X-RAY SPECTROMETER DEVELOPMENT FOR EFFECTS TESTING

Award Information
Agency:
Department of Defense
Branch:
Defense Threat Reduction Agency
Amount:
$49,846.00
Award Year:
1988
Program:
SBIR
Phase:
Phase I
Contract:
N/A
Agency Tracking Number:
8255
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Advanced Research & Applctns
425 Lakeside Dr, Sunnyvale, CA, 94086
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
N/A
Principal Investigator
 LOUIS N KOPPEL
 (408) 733-7780
Business Contact
Phone: () -
Research Institution
N/A
Abstract
THE EMERGING IMPORTANCE OF NUCLEAR-WEAPON AND DIRECTED ENERGY WEAPON (DEW) EFFECTS TESTING IN THE SOFT X-RAY REGIME HAS HIGHLIGHTED THE NEED FOR A ROBUST, ACCURATE AND RELIABLE SOFT X-RAY SPECTROMETER THAT WILL MEASURE FLUENCE INCIDENT ON UGT TEST-ARTICLES. THE NEW LAYERED SYNTHETIC MICROSTRUCTURE (LSM) X-RAY INTERFERENCE MIRROR TECHNOLOGY IS PROPOSED AS THE BASIS FOR A SPECTROMETER RESPONSIVE TO THIS NEED. THE PHASE I PROJECT WILL RESOLVE TECHNICAL RISK ISSUES ASSOCIATED WITH THE SURVIVABILITY OF SPECTROMETER COMPONENTS IN THE UGT ENVIRONMENT, WITH THE ARCHITECTURE OF A MULTICHANNEL INSTRUMENT, AND WITH THE QUALITY OF THE DATA IT WILL PROVIDE AS A PRIME UGT DIAGNOSTIC. THE PHASE I EFFORT WILL ESTABLISH A DESIGN BASIS FOR A PROTOTYPE INSTRUMENT THAT WILL BE CONSTRUCTED AND EXPERIMENTALLY EVALUATED IN PHASE II.

* information listed above is at the time of submission.

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