GAAS WAFER TESTING FOR RADIATION-INDUCED TRANSIENT UPSET

Award Information
Agency: Department of Defense
Branch: Defense Advanced Research Projects Agency
Contract: N/A
Agency Tracking Number: 9382
Amount: $243,687.00
Phase: Phase II
Program: SBIR
Awards Year: 1991
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
Advanced Research & Applctns
425 Lakeside Dr, Sunnyvale, CA, 94086
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Dr L J Palkuti
 (408) 733-7780
Business Contact
Phone: () -
Research Institution
N/A
Abstract
THE DEVELOPMENT OF A WAFER-LEVEL TESTING TECHNIQUE FOR MULTIGIGAHERTZ GAAS DIGITAL INTEGRATED CIRCUITS TO CHARACTERIZE THE TRANSIENT-RADIATION-INDUCED UPSET LEVEL IS PROPOSED. THIS CONCEPT WILL ALLOW THE OPTIMIZATION OF THE UPSET LEVEL IN HIGH PIN-OUT DENSITY CIRCUITS USING AN ON-SITE, QUICK TURNAROUND PROCEDURE FOR TECHNOLOGY DEVELOPMENT AS WELL AS CIRCUIT SCREENING. THIS NONDESTRUCTIVE TECHNIQUE CAN BE APPLIED TO ESTABLISH THE ULTIMATE UPSET LEVEL WITHOUT EXPENSIVE OFF-SITE QUALIFICATION TESTING. THE PHASE I FEASIBILITY STUDY WILL INCLUDE THE THE IMPLEMENTATION OF SUITABLE SUBBANDGAP LASER SOURCE FOR WAFER-LEVEL SIMULATION, THE DEVELOPMENT OF A SUITABLE DATA BASE TO ESTABLISH CORRELATION BETWEEN LASER AND CONVENTIONAL LINAC SIMULATION FOR VARIOUS TEST DEVICES AND CIRCUITS; AND DEMONSTRATION OF THE APPLICABILITY OF THE LASER SIMULATION TECHNIQUE TO STATE-OF-THE-ART GAAS CIRCUITS BY EXTENDING THE EXPERIMENTAL DATA BASE WITH PHOTORESPONSE SIMULATION.

* information listed above is at the time of submission.

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