AUTOMATED RADIATION/RELIABILITY VLSI QUALIFICATION

Award Information
Agency:
National Aeronautics and Space Administration
Branch:
N/A
Amount:
$500,000.00
Award Year:
1991
Program:
SBIR
Phase:
Phase II
Contract:
N/A
Agency Tracking Number:
11898
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Advanced Research & Applctns
425 Lakeside Drive, Sunnyvale, CA, 94086
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
N/A
Principal Investigator
 Leslie J. Palkuti
 Manager, Semiconductor
 (408) 733-7780
Business Contact
 R. A. ARMISTEAD
Title: PRESIDENT
Phone: (408) 733-7780
Research Institution
N/A
Abstract
THE DEVELOPMENT OF AN AUTOMATED TEST METHOD TO EXTRACT CMOS VLSI CIRCUIT PARAMETERS TO ASSESS HOT-ELECTRON RELIABILITY AND RADIATION HARDNESS IS PROPOSED. THE INSTRUMENT, COMBINED WITH STANDARDIZED TEST CHIPS, WOULD BE UNIQUELY SUITED FOR QUALIFICATION OF LOW-VOLUME ASIC CIRCUITS FOR SPACEBOURNE APPLICATIONS. THE PROPOSED CONCEPTINCLUDES THE DEVELOPMENT OF AUTOMATED TRANSFER OF TEST DEVICES BETWEEN X-RAY IRRADIATION, TIME/TEMPERATURE ANNEALING AND ELECTRICAL TESTING STATIONS UNDER ELECTRICAL BIAS. IN ADDITION, THE PROGRAM WILL ADDRESS THE TESTING THROUGHPUT NEEDED TO ACHIEVE A LOW-COST QUALIFICATION PROCESS.

* information listed above is at the time of submission.

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