AUTOMATED RADIATION/RELIABILITY VLSI QUALIFICATION

Award Information
Agency: National Aeronautics and Space Administration
Branch: N/A
Contract: N/A
Agency Tracking Number: 11898
Amount: $500,000.00
Phase: Phase II
Program: SBIR
Awards Year: 1991
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
425 Lakeside Drive, Sunnyvale, CA, 94086
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Leslie J. Palkuti
 Manager, Semiconductor
 (408) 733-7780
Business Contact
 R. A. ARMISTEAD
Title: PRESIDENT
Phone: (408) 733-7780
Research Institution
N/A
Abstract
THE DEVELOPMENT OF AN AUTOMATED TEST METHOD TO EXTRACT CMOS VLSI CIRCUIT PARAMETERS TO ASSESS HOT-ELECTRON RELIABILITY AND RADIATION HARDNESS IS PROPOSED. THE INSTRUMENT, COMBINED WITH STANDARDIZED TEST CHIPS, WOULD BE UNIQUELY SUITED FOR QUALIFICATION OF LOW-VOLUME ASIC CIRCUITS FOR SPACEBOURNE APPLICATIONS. THE PROPOSED CONCEPTINCLUDES THE DEVELOPMENT OF AUTOMATED TRANSFER OF TEST DEVICES BETWEEN X-RAY IRRADIATION, TIME/TEMPERATURE ANNEALING AND ELECTRICAL TESTING STATIONS UNDER ELECTRICAL BIAS. IN ADDITION, THE PROGRAM WILL ADDRESS THE TESTING THROUGHPUT NEEDED TO ACHIEVE A LOW-COST QUALIFICATION PROCESS.

* Information listed above is at the time of submission. *

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