AUTOMATED RADIATION/RELIABILITY VLSI QUALIFICATION

Award Information
Agency:
National Aeronautics and Space Administration
Branch
n/a
Amount:
$500,000.00
Award Year:
1991
Program:
SBIR
Phase:
Phase II
Contract:
n/a
Agency Tracking Number:
11898
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
Advanced Research & Applctns
425 Lakeside Drive, Sunnyvale, CA, 94086
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
Leslie J. Palkuti
Manager, Semiconductor
(408) 733-7780
Business Contact:
R. A. ARMISTEAD
PRESIDENT
(408) 733-7780
Research Institution:
n/a
Abstract
THE DEVELOPMENT OF AN AUTOMATED TEST METHOD TO EXTRACT CMOS VLSI CIRCUIT PARAMETERS TO ASSESS HOT-ELECTRON RELIABILITY AND RADIATION HARDNESS IS PROPOSED. THE INSTRUMENT, COMBINED WITH STANDARDIZED TEST CHIPS, WOULD BE UNIQUELY SUITED FOR QUALIFICATION OF LOW-VOLUME ASIC CIRCUITS FOR SPACEBOURNE APPLICATIONS. THE PROPOSED CONCEPTINCLUDES THE DEVELOPMENT OF AUTOMATED TRANSFER OF TEST DEVICES BETWEEN X-RAY IRRADIATION, TIME/TEMPERATURE ANNEALING AND ELECTRICAL TESTING STATIONS UNDER ELECTRICAL BIAS. IN ADDITION, THE PROGRAM WILL ADDRESS THE TESTING THROUGHPUT NEEDED TO ACHIEVE A LOW-COST QUALIFICATION PROCESS.

* information listed above is at the time of submission.

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