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X-Ray Diagnostics for High-Temperature Superconductor Processing

Award Information
Agency: Department of Energy
Branch: N/A
Contract: DE-FG03-01ER83190
Agency Tracking Number: 65165S01-II
Amount: $0.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Solicitation Year: N/A
Award Year: 2002
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
425 Lakeside Drive
Sunnyvale, CA 94086
United States
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Jonathan Kerner
 (408) 733-7780
Business Contact
 Ed LeBaker
Title: 65165
Phone: (408) 733-7780
Research Institution

65165 The development of a practical manufacturing process for high temperature superconductors is slowed by the lack of suitable diagnostic tools that can relate a rapidly measured property during production to the electrical performance of the finished product. This project will develop x-ray diagnostics to provide a rapid means of measuring film composition and crystalline texture on-line. In Phase I, a diffraction method was successfully demonstrated for rapidly measuring a texture parameter of the superconducting film, which was correlated with its ability to conduct high currents. In addition, a study of x-ray fluorescence from sample films suggested two alternate approaches for achieving high-sensitivity measurements of elemental composition. In Phase II, prototype diffraction and fluorescence instruments will be tested at facilities that are involved in the development of commercial manufacturing processes for high temperature superconductors. Commercial Applications and Other Benefits as describe by the awardee: These diagnostics should provide the national laboratories with real-time monitors of superconducting film quality, permitting rapid feedback for optimizing process parameters. The x-ray diagnostics should also be useful in the commercial sector as a quality control tool during the manufacturing process.

* Information listed above is at the time of submission. *

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