SBIR Phase I: Non-Destructive Inspection Techniques to Significantly Improve the Manufacturability of KTP Waveguides

Award Information
Agency:
National Science Foundation
Branch
n/a
Amount:
$99,977.00
Award Year:
2007
Program:
SBIR
Phase:
Phase I
Contract:
0638023
Award Id:
84652
Agency Tracking Number:
0638023
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
2310 UNIVERSITY WAY, BUILDING #1, BOZEMAN, MT, 59715
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
062674630
Principal Investigator:
ChristopherKaleva
BS
(406) 522-0388
kaleva@advr-inc.com
Business Contact:
ChristopherKaleva
BS
(406) 522-0388
kaleva@advr-inc.com
Research Institute:
n/a
Abstract
This Small Business Innovative Research project explores the feasibility of developing a manufacturing process that will both increase the rate of production and improve the yield of high quality waveguides in potassium titanyl phosphate (KTP). Waveguides in KTP are ideally suited for use in a wide variety of commercially significant laser-based applications, however, their widespread use has been limited due to cost and time associated with the current manufacturing methodology. The key innovation in this effort is to combine recent advances in non-destructive incoming wafer inspection with existing wafer level lithographic processing to increase the area for uniform waveguide fabrication (increased production). KTP waveguide technology has contributed to cutting edge research in a variety of fields including short pulse generation, wavelength stabilization and conversion, and photonics based quantum information science. Immediate commercial applications include pulsed and cw laser diode conversion to produce visible wavelengths for biomedical instrumentation. Low cost waveguides will also help enable new and emerging opportunities associated with quantum information science and secure communications, analog photonic circuits, and rapidly tunable Bragg stabilized diodes.

* information listed above is at the time of submission.

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