High Resolution Digital Imaging X-ray Detectors

Award Information
Agency:
Department of Health and Human Services
Branch
n/a
Amount:
$2,183,056.00
Award Year:
2005
Program:
STTR
Phase:
Phase II
Contract:
4R42CA110192-02
Agency Tracking Number:
CA110192
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
Aguila Technologies, Inc.
Aguila Technologies, Inc., 310 Via Vera Cruz, San Marcos, CA, 92069
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
M CAPOTE
(760) 752-1199
macapote@aguilatech.com
Business Contact:
M CAPOTE
(760) 752-1199
MACAPOTE@AGUILATECH.COM
Research Institution:
n/a
Abstract
DESCRIPTION (provided by applicant): The aim is to develop a high resolution, high contrast detector for digital x-ray imaging systems. The target detector would have a Detective Quantum Efficiency much greater than 80%, a limiting resolution of at least 10 lp/mm, ultra-low noise, linear response and a dynamic range of more than 14 bits. The proposal is to build such a detector by using CdZnTe crystals. The detector crystal is hybridized to a readout integrated circuit device that allows the signal to be collected efficiently, digitized and stored in a computer as an image matrix. The planned individual detector unit, designed for use in a slot scan system, has 192 stages in the scan direction and 384 columns in the non-scan direction. The detectors are planned to be mounted in a staggered array with overlap at the ends up to the full breast x-ray image width (approximately 25 cm) in the non-scan direction. The detector pixel pitch will be 50 microns with 100% fill factor. Compared to the present film systems, a reduction of patient dose by a factor of six can be achieved without loss of image quality. To achieve these objectives, in this proposal we plan to develop and demonstrate: a high quality and high spatial resolution bump bonding technique; an optimized readout IC for the CZT crystals; and a reliable, low-cost, high throughput technique to test and select high quality, high uniformity CZT crystals.

* information listed above is at the time of submission.

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