High-Speed Interconnects Over Copper Traces
Department of Defense
Defense Advanced Research Projects Agency
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Small Business Information
AGUILA TECHNOLOGIES, INC.
310 Via Vera Cruz, Suite 107, Suite 107, San Marcos, CA, 92078
Socially and Economically Disadvantaged:
M. Albert Capote
AbstractAs technology trends towards higher system data rates with reduced size and cost, the ability to create high-speed electrical interconnections at low cost is becoming critical. High-speed I/O, integrated along with high I/O parallellicity, is allowing interconnects to achieve over 1Tb/s of total chip-to-chip data rates. These rates are on a rapid upward trend, increasing at a rate of about 20% per year. As this trend continues, chips with many hundreds of parallel 20 Gb/s I/Os will be on the scene within the next five years. In order to compensate for the inadequacies of the inter-connect technologies, chip manufacturers are integrating low-jitter clock circuits, adaptive equali-zation and multilevel signaling into chip I/O. However, the high non-recurring costs involved in such approaches can only be afforded by the highest volume applications. Using commercial materials and printed circuit manufacturing methods, this proposed program will develop an inex-pensive technology for increasing the bandwidth of copper traces on printed circuits. The ap-proach involves using novel networks to optimize each data channel at the design stage using conventional design tools. Our techniques will permit creation of copper-clad printed circuits using conventional materials, such as FR4, yet support single channel data rates in excess of 10Gb/s.
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