Aircraft Fatigue Damage Inspection - NDE eddy current System utilizing AJM's Unique Magnetic Circuitry Technology

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8201-04-M-0159
Agency Tracking Number: F041-273-2479
Amount: $96,400.00
Phase: Phase I
Program: SBIR
Awards Year: 2004
Solicitation Year: 2004
Solicitation Topic Code: AF04-273
Solicitation Number: 2004.1
Small Business Information
101 E San Fernando St, Ste 402, San Jose, CA, 95112
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Robert Macy
 Joint Owner/CTO
 (408) 286-3984
Business Contact
 Robert Macy
Title: Joint Owner/CTO
Phone: (408) 286-3985
Research Institution
The objective of this proposal is to construct and demonstrate the feasibility and efficacy of a proposed inexpensive, low power NonDestructive Evaluation (NDE) eddy current system for determining the extent of fatigue damage in multi-layer/tapered aircraft materials. The proposed NDE eddy current system will utilize AJM's proprietary unique broadband/low noise magnetic field circuitry technology. AJM's technology applied to eddy current detection makes a system that has very high, linear sensitivity over a very broadband frequency range. The system's very low input noise level minimizes the requirement for power to be consumed in the interrogating AC magnetic field while "viewing" through multiple layers of material to very deep levels. After characterizing and verifying the system's performance, meaningful absolute data will be collected on samples of the aircraft structure to be provided. Data will then be interpreted to demonstrate the system's efficacy. The initially proposed system will use a single, specially designed reflective probe. With the cost of individual sensors at less than $100/sensor and the power requirement for each sensor at less than ½ watt/sensor future systems can utilize arrays of sensors and/or robotics to automate the NDE testing process. Such a system has many useful NDE applications.

* Information listed above is at the time of submission. *

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