NearlR Photon-counting Camera for Optical Tomography

Award Information
Agency: Department of Health and Human Services
Branch: N/A
Contract: 1R43CA101266-01
Agency Tracking Number: CA101266
Amount: $100,000.00
Phase: Phase I
Program: SBIR
Awards Year: 2003
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
RADIATION MONITORING DEVICES, INC.
RADIATION MONITORING DEVICES INC, 44 HUNT ST, WATERTOWN, MA, 02472
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 JAMES CHRISTIAN
 (617) 926-1167
 JCHRISTIAN@RMDINC.COM
Business Contact
 GERALD ENTINE
Phone: (617) 926-1167
Email: GENTINE@RMDINC.COM
Research Institution
N/A
Abstract
DESCRIPTION (provided by applicant): Early detection and routine clinical screening represent the first line of defense for preventing fatalities from cancer, a disease, which claimed 551,833, lives in the U.S. during the year 2000. Significant advances have been made in the medical imaging of tumors; however, many of these techniques are too expensive to be implemented for routine screening. Diffuse optical tomography (DOT) promises to provide a low-cost method for routine, non-invasive cancer screening. Unfortunately, the absence of appropriate imaging technologies for the high-frequency modulation techniques employed by DOT severely limits the spatial resolution and constrains the diagnostic value of DOT. This program resolves these limitations by developing a fully integrated, nearlR digital camera chip, which is an application specific integrated circuit (ASIC), that counts photons using Geiger avalanche photodiodes. This all-digital, CMOS (complementary-symmetry metal-oxide-semiconductor) imaging technology fulfills the demanding requirements for providing high-resolution DOT images. In Phase I, we will explore appropriate fabrication architectures for the ASIC and fabricate prototype pixel elements, along with the critical circuit components needed to support the pixel element. We will test the prototype devices and compare their measured performance to the initial design specifications.

* information listed above is at the time of submission.

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