High Bandwidth Optical Detector for Scanning Probe Microscopy
Department of Energy
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Radiation Monitoring Devices, Inc.
44 Hunt Street, Watertown, MA, 02472
Socially and Economically Disadvantaged:
AbstractRapid advancements in nanosciences are pushing the limits of surface probe microscopy (SPM) technology. Of particular interest is the ability to extend the SPM bandwidth of detection, which would provide more specific molecular recognition and allow studies of interaction chemistry that, to date, have been inaccessible. Such an extension also would allow higher scan rates without compromising imaging resolution. This project will develop a new high-bandwidth detector for the optical sensing of the cantilever movement in an atomic force microscope. By using a unique array of avalanche photodiodes along with custom electronics, a new detector format will be provided that is capable of detecting extremely small changes in the position of the micro-cantilever. A response bandwidth approaching 100 MHz can be achieved, and a 2-dimensional response can be provided. Commercial Applications and other Benefits as described by the awardee This work should further extend nanotechnology research and help the DOE promote SPM use and development. The higher sensitivity would allow the use of cantilevers or other probe tips to achieve wider frequency response, producing richer spectral information about the nanomaterial under investigation. The work also should be especially useful for the development of micro-cantilever-based biosensors
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