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SpectroCCD X-ray Camera for energy dispersive spectrometers
Phone: (585) 278-1168
Phone: (585) 278-1168
Worldwide there are a number of synchrotron beamlines dedicated to resonant soft x-ray inelastic scattering. There are also new beamlines currently being designed to take advantage of improved third generation synchrotron radiation sources and this powerful experimental technique for probing electronic structure. These beamlines utilize energy dispersive spectrometers and share a common need for advanced detectors that can provide better energy resolution. An energy dispersive spectrometer disperses an incident x-ray beam in such a way as to translate each x-ray energy into a corresponding position on the resulting beam. Thus, in these spectrometers energy resolution is dependent on the position resolution of the detectors used. Current state of the art detectors provide position resolution of ~25 m to 40 m. This either limits the resolvable energy resolution and/or requires long complex spectrometers to achieve the desired resolution. Researchers at a national laboratory have demonstrated the technical feasibility of a novel directdetection, soft x-ray imaging camera with 5 to 10 times better position resolution that the current state of the art. The primary objective of the program is to advance the concepts demonstrated in the laboratory to the point that commercial detectors can be produced to support the mission-focused DOE goal of enhancing fundamental energy science. The Phase I effort produced a functional prototype that was used to demonstrate performance using x-rays. In parallel, efforts were expended on the commercial engineering needed to transition this national laboratory research and development to the commercial sector. The Phase II program will implement the designs developed during Phase I and produce a beta prototype for testing at a soft inelastic x-ray scattering beamline. Commercial Applications and Other Benefits. Detectors resulting from this program will significantly improve the ability to precisely characterize atomic structures which will in turn provide considerable benefits in terms of discovery and new material science. These detectors will be especially beneficial in any sort of soft x-ray spectroscopic diagnostic. Commercial embodiments of this technology will result in better resolution for existing beamlines and enable shorter (more economical) beamlines for the future. In addition, this fine pitch detector holds promise for developing bench-top-scale spectrographs with unprecedented spectrographic x-ray resolution for industrial laboratory markets.
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