RESPONSE OF SUPERCONDUCTING MATERIALS AND ELECTRONICS TO TRANSIENT RADIATION

Award Information
Agency: Department of Defense
Branch: Defense Threat Reduction Agency
Contract: N/A
Agency Tracking Number: 12200
Amount: $50,000.00
Phase: Phase I
Program: SBIR
Awards Year: 1990
Solitcitation Year: N/A
Solitcitation Topic Code: N/A
Solitcitation Number: N/A
Small Business Information
Amador Research Corp
4737 Ross Gate Ct, Pleasanton, CA, 94566
Duns: N/A
Hubzone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Dr D Lynn Shaeffer
 (415) 423-0858
Business Contact
Phone: () -
Research Institution
N/A
Abstract
AN EXPERIMENT IS PROPOSED TO DEMONSTRATE THAT TRANSIENT X-RAY RADIATION FROM THE PHYSICS INTERNATIONAL PULSERAD 1150 FLASH X-RAY MACHINE WILL CAUSE A REPRESENTATIVE HIGH TEMPERATURE SUPERCONDUCTING (HTS) DEVICE TO MALFUNCTION BY REVERTING TO NORMAL CONDUCTIVITY. INTEREST IN THIS PHENOMENON IS MOTIVATED BY THE ANTICIPATED INCORPORATION OF HTS THIN FILM TECHNOLOGY IN DEFENSE ELECTRONICS, ESPECIALLY SATELLITES, IN THE NEAR-FUTURE. THE ELECTRONICS WILL BE VULNERABLE (I.E., RADIATION SOFT) TO SPACE RADIATION OR A NUCLEAR WEAPON RADIATION ENVIRONMENT. POTENTIALLY DAMAGING TRANSIENT VOLTAGES WILL OCCUR WHEN THE HTS MATERIAL GOES NORMAL. PERMANENT DAMAGE MAY ALSO RESULT. THE DEVICE CHOSEN HERE IS A LOW-Q MICROWAVE RESONATOR MANUFACTURED BY WESTINGHOUSE SCIENCE AND TECHNOLOGY CENTER AND CONSISTING OF YBCO DEPOSITED ON A MGO SUBSTRATE. ALTHOUGH HIGH-Q HTS RESONATORS ARE AVAILABLE, A LOW-Q RESONATOR WILL RESPOND IN A TIME SHORT COMPARED TO THE 50 NS X-RAY PULSE. THE S(12) PARAMETER WILL BE MEASURED AS A FUNCTION OF FREQUENCY WITH A SYNTHESIZER, S-PARAMETER TEST SET, AND NETWORK ANALYZER. A WIDEBAND OSCILLOSCOPE WILL BE EMPLOYED TO MEASURE RESPONSE AS A FUNCTION OF TIME. THE Q AND DEVICE RESISTANCE WILL BE OBTAINED AS A FUNCTION OF TIME, DOSE, AND DOSE RATE.

* information listed above is at the time of submission.

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