Tin Whisker Mitigation by Photonic Sintering for Sn-based Surface Finishes

Award Information
Agency:
Department of Defense
Branch:
Missile Defense Agency
Amount:
$100,000.00
Award Year:
2009
Program:
STTR
Phase:
Phase I
Contract:
HQ0006-09-C-7077
Agency Tracking Number:
B08B-010-0020
Solicitation Year:
2008
Solicitation Topic Code:
MDA08-T010
Solicitation Number:
2008.B
Small Business Information
Applied Nanotech, Inc.
3006 Longhorn Blvd., Suite 107, Austin, TX, 78758
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
013475129
Principal Investigator
 Mohshi Yang
 Principal Investigator
 (512) 339-5020
 myang@appliednanotech.net
Business Contact
 Nancy Ruel
Title: Contracts Manager
Phone: (512) 339-5020
Email: nruel@appliednanotech.net
Research Institution
 University of Maryland
 Michael Osterman
 1103 Engineering Lab Building
College Park, MD, 20742 9121
 (301) 405-5323
 Nonprofit college or university
Abstract
For decades Sn/Pb components and circuit assemblies have been used for high reliability, high performance military and Air Force applications. With new legislation intended to eliminate lead from electronics manufacturing and packaging, the next generation of high performance devices will need to use only lead free technology. Unfortunately, lead free tin surfaces may form whiskers that may grow in length to cause electrical short circuits between adjacent components and devices. ANI has worked extensively on metallic conductive inks, successfully developing a copper conductive ink using copper metallic nanoparticles for inkjet printed electronic applications. This extraordinary success was achieved using a proprietary sintering process whereby a very short flash of photonic energy transforms the dried copper ink to metallic copper traces with conductivities close to levels expected for bulk Cu. We have demonstrated that this sintering process can totally flatten and eliminate copper nanowires and whiskers. We propose to extend this success, utilizing the sintering process as a post-deposition step to eliminate tin whiskers that may develop during the electrodeposition process. The systems are inexpensive, are commercially available, require less than one second process time, and can be integrated easily with current electrodeposition systems.

* information listed above is at the time of submission.

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