Terahertz Frequency Materials Testing at Cryogenic Temperatures and in High Magnetic Fields

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8650-15-C-1727
Agency Tracking Number: F12B-T08-0003
Amount: $749,824.00
Phase: Phase II
Program: STTR
Solicitation Topic Code: AF12-BT08
Solicitation Number: 2012.2
Solicitation Year: 2012
Award Year: 2015
Award Start Date (Proposal Award Date): 2014-12-04
Award End Date (Contract End Date): 2017-03-06
Small Business Information
575 McCorkle Blvd., Westerville, OH, 43082
DUNS: 51815553
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 David Daughton
 (614) 891-2243
Business Contact
 Rob Ellis
Title: Mr.
Phone: (614) 212-1468
Email: rob.ellis@lakeshore.com
Research Institution
 Wright State University
 Dr. David C Look
 134 Oelman Hall
Dayton, OH, 45435
 (937) 528-8741
 Nonprofit college or university
ABSTRACT: Temperature and magnetic field dependent terahertz spectroscopies have proven useful for characterizing novel electronic and magnetic materials. To this end, we are developing a turn-key, continuous-wave (CW) terahertz transmission platform operating from 5 K to 300 K with fields up to 9 T. Fiber-coupled photoconductive switches operate from 200 GHz to 1.2 THz in the cryogenic and high-field sample environment -- eliminating the need to align a THz beam through multiple cryostat windows. In Phase I, first generation prototype hardware demonstrated the promise of this approach especially for characterization of thin-film electronic materials. This proposal focuses on finalizing development, application, validation, and software integration of the experimental methods and physical models that ultimately form the heart of a commercial THz material characterization system. In this work, the accuracy of material parameter extraction algorithms will be improved with the development of a calibration procedure specific to this experimental platform. Upgrades to first generation hardware, including a more phase-stable CW-THz spectrometer, will improve the efficiency and reliability of signal acquisition. Finally, the hardware, calibration and material property extraction algorithms will be validated through a series of Hall and CW-THz characterization measurements on conductive ZnO thin films.; BENEFIT: This system will be an affordable, compact, convenient-to-use measurement platform focused on the characterization needs of researchers of novel electronic and magnetic materials. As a turnkey solution conditioned with the necessary cryogenic/ magnetic sample environment and application-specific software, scientist users who are not necessarily optics and THz experts can rapidly begin productive and illuminating material characterization work. THz characterization is expected to help reveal new properties of materials being studied for high speed semiconductor, THz sensors, photovoltaics, organic electronics, and spintronics applications, as well as chemical/biological threat detection.

* Information listed above is at the time of submission. *

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