Transmitted Wavefront Metrology of Multiple-Layer Dome Optics Using a Scanning Low-Coherence Dual Interferometer (SLCDI)

Award Information
Agency:
Department of Defense
Branch
Army
Amount:
$69,873.00
Award Year:
2006
Program:
SBIR
Phase:
Phase I
Contract:
W31P4Q-06-C-0203
Award Id:
78565
Agency Tracking Number:
A052-151-0236
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
2489 Brighton Henrietta Town Line Rd., Rochester, NY, 14623
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
839401205
Principal Investigator:
Damon Diehl
Optical Engineer / Scientist
(585) 424-0335
damond@aseoptics.com
Business Contact:
Christopher Cotton
President
(585) 303-1574
chrisc@aseoptics.com
Research Institution:
n/a
Abstract
We propose a scanning low-coherence dual interferometery system that can accurately measure the optical thickness of hemispheric optical domes used as missile windows. The system has the unique capability to measure the optical thicknesses of individual layers within domes composed of multiple materials. The optical thickness map created during the scanning process is directly related to the wavefront transmission properties of the dome.

* information listed above is at the time of submission.

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