Transmitted Wavefront Metrology of Multiple-Layer Dome Optics Using a Scanning Low-Coherence Dual Interferometer (SLCDI)

Award Information
Agency: Department of Defense
Branch: Army
Contract: W31P4Q-06-C-0203
Agency Tracking Number: A052-151-0236
Amount: $69,873.00
Phase: Phase I
Program: SBIR
Awards Year: 2006
Solitcitation Year: 2005
Solitcitation Topic Code: A05-151
Solitcitation Number: 2005.2
Small Business Information
ASE OPTICS
2489 Brighton Henrietta Town Line Rd., Rochester, NY, 14623
Duns: 839401205
Hubzone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Damon Diehl
 Optical Engineer / Scientist
 (585) 424-0335
 damond@aseoptics.com
Business Contact
 Christopher Cotton
Title: President
Phone: (585) 303-1574
Email: chrisc@aseoptics.com
Research Institution
N/A
Abstract
We propose a scanning low-coherence dual interferometery system that can accurately measure the optical thickness of hemispheric optical domes used as missile windows. The system has the unique capability to measure the optical thicknesses of individual layers within domes composed of multiple materials. The optical thickness map created during the scanning process is directly related to the wavefront transmission properties of the dome.

* information listed above is at the time of submission.

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